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Metrology SeriesIndustrial CT systems for dimensional metrology

Metrology SeriesIndustrial CT systems for dimensional metrology

ÉTalk to a metrology expert
HomeMetrology Series
450kV

System compatible up to

6 configurations

Available in Metrology Series

0.5 °C

Internal thermal regulation

Metrology Series – CT system for 3D dimensional measurement

Industrial CT systems for dimensional metrology

The Metrology Series is a line of industrial CT systems for 3D dimensional metrology. They measure internal and external features non-destructively, with a maximum permissible error (MPE) defined according to the VDI/VDE 2630-1.3 reference standard. (opening paragraph read in summary only – to be checked against the page)

X-ray tomography has revolutionised research, but also industrial quality control, by enabling complete three-dimensional analyses, internal and external, in a single scan and above all non-destructively (NDT).

For dimensional measurement, more traditional methods have long dominated the field: tactile coordinate measuring machines (CMMs), 3D optical scanners, vision systems and portable measuring arms. Each excels in its own domain: CMMs for high point-by-point precision, optical scanners for speed over large surfaces, vision systems for 2D measurements, and portable arms for flexibility on site. These methods remain relevant and will continue to be for many applications. However, they share a common limitation: they cannot access internal geometries without cutting or disassembly.

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CT tomography overcomes this limitation by providing a complete volumetric view while preserving the integrity of the part. It reconstructs the full 3D volume and makes it possible to measure internal and external geometries, wall thicknesses, geometric and dimensional tolerances (GD&T) and CAD-to-actual deviations simultaneously, with a data density that traditional approaches cannot match.

But turning this technological capability into reliable metrological results takes more than a simple CT scanner. That is where our Metrology Series comes in: industrial CT systems designed specifically for high-precision dimensional metrology. Certified to VDI/VDE 2630, with a clearly defined maximum permissible error (MPE) and verified performance, these platforms guarantee traceability, repeatability and comparability of results over time – solid, auditable metrological evidence.

Available in the EasyTom S Metrology (small to medium-sized parts) and EasyTom L Metrology (large parts and high flexibility) configurations, these systems combine the power of 3D tomography with the rigour of industrial metrology equipment. This solution meets the needs of R&D, industrialisation and quality teams: more accurate decisions, shorter development cycles and more reliable series inspection.

Metrology Series – Dimensional measurements by tomography

Metrology SeriesVDI/VDE 2630: the reference standard for CT metrology

How can the traceability of dimensional measurements by CT be guaranteed?

 
A CT scanner can produce beautiful 3D images and reveal the internal structures of a part. But that does not make it a metrology system. The difference? Certification to VDI/VDE 2630.

What is the VDI/VDE 2630 standard?

Developed by the Association of German Engineers (VDI) and the German Association for Electrical, Electronic & Information Technologies (VDE), this standard defines standardised methods for:

  • Testing and qualifying the metrological performance of a CT system
  • Determining the system’s maximum permissible error (MPE)
  • Establishing periodic verification protocols
  • Guaranteeing the traceability of measurements to international standards

What VDI/VDE certification guarantees:

  • Traceability – every measurement can be linked to certified artefacts
  • Repeatability – results remain stable over time
  • Comparability – results can be compared between different systems
  • Documentation – an official performance report is supplied

The Metrology Series at RX Solutions

RX Solutions Metrology Series systems stand out through an approach dedicated to dimensional metrology by tomography. Beyond compliance with VDI/VDE 2630-1.3 and ASME B89.4.23, our CT systems integrate hardware and software technologies exclusive to the Metrology Series, guaranteeing stability, traceability and repeatability for your measurements, day after day.

Hardware dedicated to precision

Linear encoders
Linear encoders
Dampers
Dampers
Internal thermal regulation ±0.5 °C
Internal thermal regulation ±0.5 °C
Linear encoders
Micron-level precision with backlash compensation for unrivalled motion repeatability
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Dampers
Combined with a highly stable granite base to isolate the system from external vibration
×
Internal thermal regulation ±0.5 °C
Keeps the detector, the X-ray source and the manipulator at a stable temperature, eliminating thermal drift during scans
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Software tools dedicated to the Metrology Series

Scaling Error plug-in: automatic scale correction

Enables precise determination of the system’s true magnification. It automatically detects the certified ball-bar and applies a scale correction that compensates for thermal and geometric micro-variations.

Advanced STL export with sub-pixel surface determination

The built-in STL export uses sub-pixel surface determination algorithms that extract geometries with a precision finer than the voxel size.

Full compatibility with the main metrology software

Metrology Series systems are natively compatible with:

  • VGStudio Max
  • PolyWorks Inspector
  • VG Inline

Metrological support and calibration

Traceability and performance guaranteed over time

Complete factory calibration

Before delivery, every Metrology Series system undergoes a double factory calibration: detector distortion correction and ultra-fine orientation. This calibration guarantees VDI/VDE 2630-1.3 compliance from installation. A BEP (Best Equipment Performance) report documenting the performance tests is supplied with every system.

Support and annual recalibration

Our dedicated support programme includes an annual performance check (or more frequent if needed). If drift is detected, our teams carry out an on-site recalibration to maintain VDI/VDE 2630-1.3 compliance throughout the system’s life cycle.

Certified ball-bar gauge included

Every system is delivered with a certified 100 mm ball-bar enabling automatic daily scale correction via the Scaling Error plug-in. This gauge guarantees traceability to national institutes (PTB, NIST, LNE) and allows regular checks of the system’s metrological performance.


Guaranteed metrological compliance

 
Thanks to the initial factory calibration, the daily verification tools (ball-bar) and the annual maintenance programme, your Metrology Series systems remain compliant with the VDI/VDE 2630-1.3 and ASME B89.4.23 metrological standards over time.

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Metrology SeriesWhich CT platform for your metrology application?

Whether you use the Explorer, Nano or Force line, the Metrology Series lets you customise your industrial CT system. Two platforms with 6 configurations are currently compatible with the Metrology Series, to fit your requirements precisely: available space, part size and weight…  
Product lines
EXPLORER
NANO
FORCE
Platforms
EasyTom S
EasyTom L
EasyTom XL
EasyTom B
EasyTom L
EasyTom XL
UltraTom
EasyTom L
EasyTom B
Series
Metrology Series



Fab Series





Performance
Resolution
         
         
         
         
         
         
         
         
         
Sample density
         
         
         
         
         
         
         
         
         
EXPLORER EasyTom S
Series
Metrology Series   
Fab Series   
Performance
Resolution            
Sample density            
EXPLORER EasyTom L
Series
Metrology Series   
Fab Series   
Performance
Resolution            
Sample density            
EXPLORER EasyTom XL
Series
Metrology Series  — 
Fab Series   
Performance
Resolution            
Sample density            
EXPLORER EasyTom B
Series
Metrology Series  — 
Fab Series  — 
Performance
Resolution            
Sample density            
NANO EasyTom L
Series
Metrology Series   
Fab Series  — 
Performance
Resolution            
Sample density            
NANO EasyTom XL
Series
Metrology Series  — 
Fab Series  — 
Performance
Resolution            
Sample density            
NANO UltraTom
Series
Metrology Series   
Fab Series  — 
Performance
Resolution            
Sample density            
FORCE EasyTom L
Series
Metrology Series   
Fab Series  — 
Performance
Resolution            
Sample density            
FORCE EasyTom B
Series
Metrology Series   
Fab Series  — 
Performance
Resolution            
Sample density            

Metrological CT platforms

EasyTom S
EasyTom S
EasyTom L
EasyTom L
EasyTom S
N° of axes: 4+2 (centring stage in option)
Max SSD: 612 mm
Max scan volume: Ø 230 mm x H 380 mm
Max resolution: 5 µm

Sample   

Max sample size: Ø 300 mm x 410 mm
Max sample weight: 5 kg
Internal loader 6: Ø 45 mm x H 155 mm
Internal loader 3: Ø 175 x H 155 mm

General   
Weight: 1020 kg
Dimensions: 1345(W) x 900(D) x 1870(H) mm
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EasyTom L
N° of axes: 6+2* (*platine de centrage en option)
Max SSD: 1015 mm
Max scan volume: Ø 500 mm x H 580 mm
Max resolution: 4 µm

Sample
Max sample size: Ø 685 mm x 900 mm
Max sample weight: 30 - 80 kg
Internal loader 6: Ø 70 mm x H 220 mm
Internal loader 3: Ø 120 x H 220 mm

General   
Weight: 3700 kg - 5850 kg
Dimensions: 2400 (W) × 1200 (D) × 2000 (H) mm
×

EasyTom S: MPE (VDI/VDE 2630-1.3, MPE SD)


EasyTom S 150 — detector 25x32: VCI/VDE 2630-1.3 MPE SD : 5,5 µm + L/50

EasyTom: MPE (VDI/VDE 2630-1.3, MPE SD)


EasyTom L 230 — detector 25x32 : VCI/VDE 2630-1.3 MPE SD : 5,5 µm + L/50
EasyTom L 230 — detector 43x43 : VCI/VDE 2630-1.3 MPE SD : 6 µm + L/50
EasyTom L 300 — detector 25x32 : VCI/VDE 2630-1.3 MPE SD : 5,5 µm + L/50
EasyTom L 300 — detector 43x43 : VCI/VDE 2630-1.3 MPE SD : 6 µm + L/50
EasyTom L 450 — detector 43x43 : VCI/VDE 2630-1.3 MPE SD : 5,5 µm + L/50

Not sure which platform to choose?

Contact an RX expert

Metrology SeriesStrengths of the Metrology Series at RX Solutions

01

Hardware precision

Linear encoders, dampers on a granite base and internal thermal regulation limit drift and ensure good repeatability.
02

Software dedicated to metrology

Scaling Error plug-in for automatic scale correction, and STL export with sub-pixel surface determination, as native functions.
03

Guaranteed factory calibration

Double factory calibration before delivery, with a BEP report. Annual on-site verification and recalibration.
04

Certified compliance

Compliance with VDI/VDE 2630-1.3 and ASME B89.4.23, with traceability to national institutes (PTB, NIST, LNE).

Discover our lines

Still unsure which CT system and which customisation suits you best? Find out how to define your needs:

Qualify my needs


Dental part scanned by Explorer micro-tomography Aerospace part in metal additive manufacturing 

EXPLORER

Versatile micro-tomography

2 µm RESOLUTION
300 kV SOURCE VOLTAGE
< 1 µm MIN. VOXEL

Reveal the invisible at the micron scale.

Access the finest microstructures, porosities and interfaces with a resolution down to the nanometre scale.

Platforms Easytom S · Easytom L · Easytom XL · EasyTom B
 Discover the Explorer line      
Microscopic structure analysed at nanometric resolution Life sciences, Wood

NANO

Nanometric analysis

250 nm RESOLUTION
160 kV SOURCE VOLTAGE
30 nm MIN. VOXEL

Reveal the smallest details with nanometric precision.

Nanometric resolutions to characterise microstructures, porosities and interfaces at a scale that optical microscopy cannot reach.

Platforms Easytom L · Easytom XL · Ultratom
 Discover the Nano line      
Electronic component inspected by Force high-energy tomography Titanium additive manufacturing injector 

FORCE

High-energy solution

4 µm RESOLUTION
450 kV SOURCE VOLTAGE
250 kgs Load up to

See through the densest materials.

Inspect thick metal parts, complex assemblies and highly absorbing components with optimal image quality.

Platforms Easytom L · Easytom B
 Discover the Force line      

FAQ METROLOGY Series

What is RX Solutions’ Metrology Series?
The Metrology Series is a line of industrial CT systems designed for 3D dimensional metrology. It enables non-destructive measurement of internal and external features with accuracy guaranteed to the VDI/VDE 2630 standard, and integrates dedicated hardware and software components to ensure traceability, repeatability and certified measurement accuracy.
What does MPE mean for my measurements?
The MPE (Maximum Permissible Error) is the maximum permissible measurement error defined according to the VDI/VDE 2630 standard, using calibrated artefacts under controlled conditions. It indicates the metrological potential of the CT system – useful for comparing machines and establishing verification protocols – but it does not guarantee the accuracy of each individual measurement.
Why choose CT for dimensional metrology?
CT metrology offers complete three-dimensional analysis, enabling the simultaneous measurement of internal and external geometries, wall thicknesses, GD&T tolerances and CAD-to-part deviations – all in a single scan and without damaging or cutting the part, unlike traditional measurement methods.
What is the difference between a standard CT system and a Metrology Series CT system?
Unlike standard CT systems, the Metrology Series integrates hardware and software specifically designed for dimensional metrology: linear encoders, ±0.5 °C internal thermal regulation, factory calibration, distortion correction, and full VDI/VDE 2630 compliance. This guarantees the traceability, repeatability and comparability of results.
What does VDI/VDE 2630-1.3 certification mean for my measurements?
VDI/VDE 2630-1.3 is the German reference standard used to certify the metrological performance of CT systems. It guarantees traceability (link to national standards), repeatability (stability over time), comparability, and official documentation of performance.
Which software is compatible with the Metrology Series?
Metrology Series systems are natively compatible with the main dimensional metrology software, including VGStudio Max, PolyWorks Inspector, Geomagic Control X and VG Inline, and offer advanced STL export with sub-pixel surface determination.
Can an industrial CT system replace other measurement methods (CMM, optical, vision, robot)?
CT metrology is complementary to traditional methods. It excels at volumetric, internal and complex measurements, while CMMs and optical scanners remain essential for high-precision measurements on accessible surfaces and for rapid in-line inspections.

Download the brochure




Talk about my metrology application


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