Thursday, November 19 ‧ 10 AM–4 PM ‧ RX Solutions Open Day: Discover Industrial X-Ray CT in Annecy Register
Nano LineGet submicron 3D data down to 250 nm

Nano LineGet submicron 3D data down to 250 nm

Designed for the most demanding research and R&D applications, RX Solutions’ Nano line combines very high resolution, image quality, experimental flexibility and scalability.

Échanger avec un expert Nano-CT
HomeNano Line - Down to 250 nm
Nanometric scan – tomography
Grain of sand
X-ray nano-tomography, or nano-CT, makes it possible to characterise in 3D the internal structure of a material or sample at the submicron scale. It gives access to details that are invisible with conventional micro-tomography: fine porosities, cracks, interfaces, fibres, grains, microstructures, internal defects or evolving mechanisms.

With a resolution of up to 250 nm, the Nano line of RX Solutions CT systems is aimed at academic laboratories, industrial research centres and R&D teams that need reliable 3D data to understand, compare, validate and publish.

They trust us with their Nano system

Safran
Schneider electric
L'oréal
Michelin
Valeo
ariane group
legrand
dupond
BIC


250 nm

Resolution down to

50 nm

Voxel mini

160 kV

Max voltage

The RX Solutions Nano-CT system range
Easy Tom L ● Easy Tom XL ● Ultra Tom 
Dr Leire San Felices, Co-head of the unit
« L’incorporation du système la Nano EasyTom XL de RX Solutions nous a permis d’élargir l’échelle d’étude, passant des centaines de nanomètres aux microns et centaines de microns. Nous pouvons désormais produire des images tridimensionnelles détaillées de systèmes complexes, sans avoir à les détruire ni les modifier. »
Read the full testimonial from the University of the Basque Country

Nano-CT,
when microtomography is no longer enough

Standard micro-CT systems deliver excellent performance for many applications, but some analyses require a much finer level of detail. When the structures to be observed are at the submicron scale, a few microns of resolution are no longer enough to reveal the phenomena actually at play.
This is the case, for example, when analysing advanced materials, composites, ceramics, batteries, biological samples, rocks, polymers, parts made by additive manufacturing or complex porous structures.

  • Critical details remain invisible or insufficiently defined.
  • Submicron systems can lack the flexibility to integrate complex experimental setups.
  • Acquisition times can become very long.
  • Operation often requires advanced expertise.
  • Overly specialised solutions sometimes limit the field of application to very small samples.
 Discuss my Nano-CT application 

   NANO  Line   very high resolution, with no compromise 

La gamme Nano a été conçue pour apporter la plus haute résolution CT à la caractérisation 3D et aux expérimentations scientifiques avancées. Elle repose sur une architecture pensée pour combiner performance d’imagerie, stabilité mécanique, flexibilité d’usage et évolutivité dans le temps.

Request a demo

Submicron

Observe microstructures, interfaces, fine porosities and phenomena that are invisible with conventional micro-CT, thanks to a resolution of down to 250 nm, and visualise the finest details.

Modularity: Ultra and Access

Two configurations of the Nano line to meet a variety of research needs:

Nano Ultra favours ultimate resolution for the most demanding work.

Nano Access offers submicron imaging for precise inspections over a wider field of view.
One technology, several levels of performance depending on your objectives.

Dual sources

Why choose between field of view and resolution?

Dual Micro/Nano source configurations make it possible to switch instantly from a micro-focus source to a nano-focus source to adapt the analysis to each sample. A single platform thus covers several observation scales and several research projects.

Collaborative research

PhD students, researchers, platform engineers and materials experts do not all have the same experience of CT. Intuitive interfaces, automated settings and quick configuration changes make the system easier to use and encourage its use by several teams on the same platform.

Built to last and evolve

Detectors, dual Micro/Nano source, in-situ devices or new features: the Nano line evolves with your research projects. Thanks to our Care & Performance offer, our teams support you over time to maintain the system’s performance, train new users and protect your investment in the long term.

What the Nano line allows you to do

See what was previously invisible

Characterise structures, defects and mechanisms down to the submicron scale: fine porosities, cracks, interfaces, grains, fibres, internal networks or complex microstructures.

Run 4D experiments more simply

Follow the evolution of a sample over time, directly inside the CT system, by integrating your experimental setups. This approach makes it possible to observe dynamic phenomena without destroying the sample and without compromising image quality.

Get usable results faster

Thanks to an optimised imaging chain, automated acquisitions and batch reconstructions, you reduce handling time and increase the number of experiments carried out with the same resources.

Gain autonomy

Built-in automation makes settings, configuration changes and routine operations easier. Your teams can focus on scientific analysis rather than on machine complexity.

Invest in a durable platform

The Nano line is designed to support your needs over time: new detectors, options, advanced software and accessories can be added throughout the life of the system.

The Nano line in summary

With the RX Solutions Nano line, you access 3D data down to 250 nm, carry out advanced 4D experiments, reduce your handling times and benefit from a flexible, scalable platform designed to maximise your laboratory’s productivity.

 Assess the nano-CT potential of my application

 Examples of Nano-CT applications

The Nano line is aimed at applications where a fine understanding of matter becomes decisive: revealing submicron porosity, following the evolution of a microstructure, analysing an interface, characterising a fibre, observing an internal defect or comparing several states of a material without destroying the sample.
Batteries & energy
Composites & advanced materials
Additive manufacturing
Biomaterials & life sciences
Geosciences & natural materials
Electronics & microtechnologies
Electrode degradation, cracks, porosities, interfaces and changes over time.
Batteries & energy

Fibre orientation, internal defects, fine porosities, phase separation.
Composites & advanced materials

Powders, lattice structures, thin walls, internal defects, porosities and geometric conformity.
Additive manufacturing

Porous structures, bone, mineralised tissues, natural or biological microstructures.
Biomaterials & life sciences

Pore networks, microcracks, grains, flow paths and internal structures.
Geosciences & natural materials

Fine assemblies, interconnections, internal layers, packaging defects.
Electronics & microtechnologies

The Nano line is available on several platforms

The Nano line is available on three platforms: EasyTom L, EasyTom XL and UltraTom. The choice depends on the sample volume, the target resolution, the installation environment and your experimental constraints: compact sample, larger part, multi-scale need, in-situ experiment or shared laboratory.

Product lines
EXPLORER
NANO
FORCE
Platforms
EasyTom S
EasyTom L
EasyTom XL
EasyTom B
EasyTom L
EasyTom XL
UltraTom
EasyTom L
EasyTom B
Series
Metrology Series



Fab Series





Performance
Resolution
         
         
         
         
         
         
         
         
         
Sample density
         
         
         
         
         
         
         
         
         
EXPLORER EasyTom S
Series
Metrology Series   
Fab Series   
Performance
Resolution            
Sample density            
EXPLORER EasyTom L
Series
Metrology Series   
Fab Series   
Performance
Resolution            
Sample density            
EXPLORER EasyTom XL
Series
Metrology Series  — 
Fab Series   
Performance
Resolution            
Sample density            
EXPLORER EasyTom B
Series
Metrology Series  — 
Fab Series  — 
Performance
Resolution            
Sample density            
NANO EasyTom L
Series
Metrology Series   
Fab Series  — 
Performance
Resolution            
Sample density            
NANO EasyTom XL
Series
Metrology Series  — 
Fab Series  — 
Performance
Resolution            
Sample density            
NANO UltraTom
Series
Metrology Series   
Fab Series  — 
Performance
Resolution            
Sample density            
FORCE EasyTom L
Series
Metrology Series   
Fab Series  — 
Performance
Resolution            
Sample density            
FORCE EasyTom B
Series
Metrology Series   
Fab Series  — 
Performance
Resolution            
Sample density            
EasyTom L Nano
EasyTom L Nano
EasyTom XL Nano
EasyTom XL Nano
UltraTom
UltraTom
EasyTom L Nano
The EasyTom L Nano combines the submicron imaging of the Nano line with the versatility of the EasyTom L platform for samples of varying sizes and the integration of in situ devices. It is compatible with the Metrology Series to add dimensional measurement to submicron imaging.

N of axes: 6+2* (*platine de centrage en option)
Max SSD: 1015 mm
Max scan volume: Ø 500 mm x H 580 mm
Max resolution: 250 nm

Sample
Max sample size: Ø 685 mm x 900 mm
Max sample weight: 30 - 80 kg
Internal loader 6: Ø 70 mm x H 220 mm
Internal loader 3: Ø 120 x H 220 mm

Weight: 3700 kg - 5850 kg
Dimensions: 2400 (W) × 1200 (D) × 2000 (H) mm
×
EasyTom XL Nano
The EasyTom XL Nano accommodates larger samples, for projects requiring a large inspection volume, and offers the flexibility needed to integrate experimental setups.

N of axes: 7+2* (*platine de centrage en option)
Max SSD: 1400 mm
Max scan volume: Ø 640 mm x H 940 mm
Max resolution: 250 nm

Sample 
Max sample size: Ø 1100 mm x 1000 mm
Max sample weight: 100 kg
Sample loader 10: Ø 90 mm x H 270 mm

General   
Weight: 4450 - 7400 kg
Dimensions: 2860 (W) × 1850 (D) × 2400 (H) mm
×
UltraTom
The UltraTom is the platform of the Nano line designed to go further, with custom configurations for in-situ imaging and complex experimental setups.

N° of axes: 7+2* (*optional centreing stage)
Max SSD: 1600 mm
Max scan volume: Ø 660 mm x H 750 mm
Max resolution: 250 nm

Sample  
Max sample size: Ø 1550 mm x 3000 mm
Max sample weight: 100 kg

General   
Weight: 7000 kg + bunker
Dimensions: 3230 (W) × 1420 (D) × 2520 (H) mm
×

 Nano Line the strengths of the Nano

01

Submicron resolution down to 250 nm

Reveal microstructures, interfaces and details that are invisible with conventional micro-tomography.
02

A modular system

Nano Access or Nano Ultra: choose the level of performance suited to your scientific objectives and research constraints.
03

One platform, several scales

Dual Micro/Nano source to cover more applications with a single piece of equipment.
04

A platform built to last

Scalability, maintenance, training and upgrades: your CT system supports your research projects over the long term. Our Care & Performance team is by your side.

The RX Solutions approach


  • Analysis of your needs. Applications, samples, experimental constraints, target resolution levels and scientific or industrial objectives.
  • Tests and performance validation. Tests to confirm the level of detail that can be achieved and compare different configurations.
  • System configuration. Definition of the platform, tubes, detectors, options, software and accessories according to real needs.
  • Manufacturing, installation and training. Manufacturing, testing, delivery, installation, commissioning and on-site training adapted to the applications.
  • Long-term support. Preventive maintenance, diagnostics, repairs, software updates, application support, further training and upgrades.
Nanometric tomography
Carbon fibre – 0.5 µm – 100 kV
Nanometric tomography – nanoCT
3DP metal cube – 0.8 µm – 160 kV
3D nano tomography
Rock wool – 0.96 µm – 100 kV
High-resolution nano CT
ROI scan – battery

FAQ: nanometric tomography

Why choose a Nano CT system rather than a micro-CT system?
A Nano CT system gives access to submicron resolution, down to 250 nm depending on the configuration, when conventional micro-CT systems reach their limits at around 2 µm. This makes it possible to observe certain very fine details.
What is resolution in CT?
Resolution is the system’s ability to distinguish two very close details in a reconstructed volume. It depends not only on voxel size, but also on the tube, the detector, mechanical stability, the geometry and the reconstruction algorithms.
What is the difference between voxel size and actual resolution?
Voxel size is a digital reconstruction parameter. On its own, it does not guarantee the system’s actual ability to distinguish small details. To compare performance, it is preferable to rely on standardised 2D and 3D resolution measurements.
What is the difference between Nano Ultra and Nano Access?
Both Nano line configurations offer submicron imaging. Nano Ultra favours ultimate resolution, down to 250 nm, for the most demanding research work. Nano Access offers submicron imaging down to 0.9 µm over a wider field of view. The choice depends on the size of your samples and the level of detail you are looking for.
What is the Nano Metrology Series?
The Metrology Series is the configuration that adds dimensional measurement to a Nano platform: in a single acquisition, you measure internal and external geometries, with performance verified against the VDI/VDE 2630 standard. It is available on two Nano platforms, the EasyTom L and the UltraTom.
Can I integrate my own experimental setups?
Yes. Nano platforms are designed to make it easy to integrate in-situ devices: internal volume, cable and pipe feedthroughs, fixtures, hollow rotation stage, slip rings and software synchronisation.
Can several analysis scales be combined in a single system?
Yes. Some configurations offer several X-ray generators, making it possible to move from an overall view to very high-resolution analysis, covering both the overall understanding and the observation of a region of interest.


Get in touch with a nano-ct expert

This site is protected by reCAPTCHA and the Google Privacy Policy and Terms of Service apply.


Discover our lines

Still unsure which CT system suits you best?

Define my needs 

Dental part scanned by Explorer micro-tomography Aerospace part in metal additive manufacturing 

EXPLORER

Versatile micro-tomography

2 µm RESOLUTION
300 kV SOURCE VOLTAGE
< 1 µm MIN. VOXEL

Reveal the invisible at the micron scale.

Access the finest microstructures, porosities and interfaces with a resolution down to the nanometre scale.

Platforms Easytom S · Easytom L · Easytom XL · EasyTom B
 Discover the Explorer line      
Microscopic structure analysed at nanometric resolution Life sciences, Wood

NANO

Nanometric analysis

250 nm RESOLUTION
160 kV SOURCE VOLTAGE
30 nm MIN. VOXEL

Reveal the smallest details with nanometric precision.

Nanometric resolutions to characterise microstructures, porosities and interfaces at a scale that optical microscopy cannot reach.

Platforms Easytom L · Easytom XL · Ultratom
 Discover the Nano line      
Electronic component inspected by Force high-energy tomography Titanium additive manufacturing injector 

FORCE

High-energy solution

4 µm RESOLUTION
450 kV SOURCE VOLTAGE
250 kgs Load up to

See through the densest materials.

Inspect thick metal parts, complex assemblies and highly absorbing components with optimal image quality.

Platforms Easytom L · Easytom B
 Discover the Force line      

Let's keep in touch? Sign up for the newsletter

By subscribing to the newsletter, you agree to receive personalised marketing communications by email, and confirm that you have read the privacy policy.