Launch of the Metrology Series for dimensional measurement

Precision specified according to the VDI/VDE 2630-1.3 standard

Each Metrology Series system is characterized according to the VDI/VDE 2630-1.3 standard. Maximum permissible error for sphere-to-sphere distance measurement (MPE_SD):

• EasyTom S: 5.5 µm + L/50
• EasyTom L: 5.5 µm + L/50 (25 × 32 format); 6 µm + L/50 (43 × 43 format)
  
  

This characterization is based on calibrated reference standards (multi-sphere gauges) and dedicated calibration procedures.

A dedicated software ecosystem in X-Act

The Metrology Series comes with specialized software functions, integrated into the X-Act software:

• advanced, sub-pixel correction of detector distortion;
• automatic scale calibration (magnification factor);
• high-quality STL export, compatible with metrology software.
  
  

CT or CMM: what metrology by CT changes

Unlike tactile or optical coordinate measuring machines (CMMs), metrological tomography inspects external geometries, internal cavities, assemblies, and porosities in a single non-destructive scan. A single Metrology Series tomograph therefore covers:

• metrology and material inspection: dimensional analysis, internal defects, porosities, multi-material assemblies, additive manufacturing parts
• CAD comparison and assembly analysis
• millions of 3D points acquired in a single scan, without complex programming
• complete traceability: calibration, performance monitoring, and compliance with industrial standards