Explorer LineExplore your materials with a single CT platform

Explorer LineExplore your materials with a single CT platform

Discover the RX Solutions Explorer line: versatile micro-CT systems for quality control, materials analysis, R&D, CT metrology and internal defect detection. Down to 2 µm resolution.

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HomeExplorer Line - Micro-CT
Industrial micro-tomography
Additive manufacturing part – 90 µm
Industrial micro-focus tomography, also known as industrial micro-CT, has become an essential tool for quality control, materials analysis, non-destructive inspection and the development of new products. RX Solutions’ Explorer line offers versatile CT systems capable of carrying out high-resolution inspections on a wide variety of materials and part sizes.

Thanks to a wide resolution range from 2 µm to over 200 µm and many generator and detector configurations, our Explorer line CT systems meet the needs of manufacturers as well as research centres 
2 µm

Résolution

300 kV

Max voltage.

1 µm

Voxel min.

100 cm

Max sample size

800 %

CT needs covered

Julien Lesseur, Research engineer, IRT Saint-Exupéry
Julien Lesseur, Research engineer, IRT Saint-Exupéry
“X-ray tomography is a complete solution for the accessibility and legibility of inspections of complex parts, compared with radiography or ultrasonic methods.”
Read the full IRT Saint-Exupéry testimonia

Which Explorer CT system suits your application?

The size of your parts, the level of detail required, your inspection rate and your installation constraints determine the choice of system. The Explorer line meets a variety of needs: compact sample, multi-scale imaging, in-situ experiments or shared laboratory.
Our experts help you choose the platform, the generator and the detector suited to your current needs, while anticipating how they will evolve.

Our experts support you in identifying the configuration best suited to your current needs while anticipating their future evolution.
EasyTom S
EasyTom S
EasyTom L
EasyTom L
EasyTom XL
EasyTom XL
EasyTom B
EasyTom B
EasyTom S
The EasyTom S is the compact platform of the Explorer line, designed for small samples. Its minimal footprint takes nothing away from image quality. It is compatible with the Metrology Series and FAB Series, so you can move on to dimensional measurement or production inspection without changing systems.

N° of axes: 4+2 (platine de centrage en option)
Max SSD: 612 mm
Max scan volume: Ø 230 mm x H 380 mm
Max resolution: 2 µm - tube 110 kV

Sample  
Max sample size: Ø 300 mm x 410 mm
Max sample: 5 kg
Internal loader 6: Ø 45 mm x H 155 mm
Internal loader 3: Ø 175 x H 155 mm

General  
Weight: 1020 kg
Dimensions: 1345(W) x 900(D) x 1870(H) mm
×
EasyTom L
The EasyTom L covers a wide range of part sizes, from small technical components to large assemblies. It is the most versatile platform of the Explorer line, with several generator and detector configurations to adapt to your application. It is compatible with the Metrology Series and FAB Series.

N° of axes: 6+2* (*Centreing stage optional)
Max SSD: 1015 mm
Max scan volume: Ø 500 mm x H 580 mm
Max resolution: 2µm with 2µm kit

Sample
Max sample size: Ø 685 mm x 900 mm
Max sample weight: 30 - 80 kg
Internal loader 6: Ø 70 mm x H 220 mm
Internal loader 3: Ø 120 x H 220 mm

General 
Weight: 3700 kg - 5850 kg
Dimensions: 2400 (W) × 1200 (D) × 2000 (H) mm
×
EasyTom XL
The EasyTom XL is designed for large samples, with an extended inspection volume. It is compatible with the FAB Series for inspecting large parts directly in production.

N° of axes: 7+2* (*Centreing stage optional)
Max SSD: 1400 mm
Max scan volume: Ø 640 mm x H 940 mm
Max resolution: 2 µm

Sample 
Max sample size: Ø 1100 mm x 1000 mm
Max sample weight: 100 kg
Internal loader 10 : Ø 90 mm x H 270 mm


General  
Weight: 4450 - 7400 kg
Dimensions: 2860 (W) × 1850 (D) × 2400 (H) mm
×
EasyTom B
The EasyTom B overcomes size and handling limits: installed in a bunker, it accommodates large or heavy parts that exceed the capabilities of standard platforms. It can also be customised for extraordinary needs.

N° of axes: 7+2*+1* (*Centreing stage optional //Optional Goniometer)
Max SSD: 2000 mm
Max scan volume: Ø 680 mm - up to H 2200 mm
Max resolution: 2 µm

Sample
Max sample size: Ø 1800 mm × H 3000 mm
Max sample size: 250 kg

General   
Weight: 1700 kg + Bunker
Dimensions: up to 3610 (W) × 1500 (D) × 3370 (H) mm
×
The Explorer line can be integrated into different RX Solutions architectures, so the system can be matched to the sample volume, the resolution required, the installation environment and the experimental constraints. The aim is to offer a configuration that fits your application: compact sample, larger part, multi-scale need, in-situ experiment or shared laboratory.

Product lines
EXPLORER
NANO
FORCE
Platforms
EasyTom S
EasyTom L
EasyTom XL
EasyTom B
EasyTom L
EasyTom XL
UltraTom
EasyTom L
EasyTom B
Series
Metrology Series



Fab Series





Performance
Resolution
         
         
         
         
         
         
         
         
         
Sample density
         
         
         
         
         
         
         
         
         
EXPLORER EasyTom S
Series
Metrology Series   
Fab Series   
Performance
Resolution            
Sample density            
EXPLORER EasyTom L
Series
Metrology Series   
Fab Series   
Performance
Resolution            
Sample density            
EXPLORER EasyTom XL
Series
Metrology Series  — 
Fab Series   
Performance
Resolution            
Sample density            
EXPLORER EasyTom B
Series
Metrology Series  — 
Fab Series  — 
Performance
Resolution            
Sample density            
NANO EasyTom L
Series
Metrology Series   
Fab Series  — 
Performance
Resolution            
Sample density            
NANO EasyTom XL
Series
Metrology Series  — 
Fab Series  — 
Performance
Resolution            
Sample density            
NANO UltraTom
Series
Metrology Series   
Fab Series  — 
Performance
Resolution            
Sample density            
FORCE EasyTom L
Series
Metrology Series   
Fab Series  — 
Performance
Resolution            
Sample density            
FORCE EasyTom B
Series
Metrology Series   
Fab Series  — 
Performance
Resolution            
Sample density            

  EXPLORER Line  Why R&D and quality teams adopt CT and the Explorer line

Manufacturers and laboratories have to develop, qualify and inspect ever more complex products while reducing analysis lead times and the associated costs. Yet traditional methods quickly show their limits.

See inside without destroying

Inspect the complete internal structure of a component without cutting or destructive preparation.

Reduce validation lead times

Quickly obtain usable 3D data to speed up decision-making.

Avoid multiplying equipment

Cover a wide range of applications (sample size, materials, resolution…) with a single CT platform.

Understand complex geometries

Analyse assemblies and complex structures that cannot be assessed with conventional methods.

Can a single platform cover all your needs?

Find out how a CT system can cover several applications, several materials and several teams.
Talk to an RX Solutions expert

The Explorer line: versatility without compromise

The Explorer line combines resolution, flexibility and ease of use in a scalable architecture, suited to research and industrial quality control alike – a versatile micro-CT platform capable of meeting the majority of industrial and scientific needs.



Contact a micro-tomography expert 

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One CT system to meet most of the CT applications

Thanks to its versatility, the Explorer line supports R&D teams, quality control laboratories, technical centres and shared platforms alike. Batteries, composites, additive manufacturing, electronics or metrology: a single platform meets a wide variety of needs.
Batteries
Additive manufacturing
Composites
Electronics
Polymers & elastomers
CT metrology
See inside battery cells, modules and components without destroying them. Analyse electrodes, identify porosities, assembly defects or ageing phenomena to improve the performance, safety and reliability of your energy storage systems.

Learn more about battery applications
Batteries
Validate the conformity of your parts before they go into production. Check porosities, internal defects and complex geometries, and easily compare the real part with its CAD model to secure your additive manufacturing processes.

Learn more about additive manufacturing applications
Additive manufacturing
Analyse fibre orientation, porosities, delaminations and internal interfaces without damaging the sample. CT helps you better understand the behaviour of composite materials and make quality inspections more reliable.

Learn more about composite materials
Composites
Inspect encapsulated components, solder joints, interconnections and complex assemblies without dismantling. Quickly detect internal defects that could affect the reliability and performance of electronic products.

 Learn more about electronics applications
Electronics
Characterise the internal structure of your polymers, identify bubbles, moulding defects, inclusions or material homogeneity issues. A valuable aid for product development, failure analysis and quality control.

 Learn more about polymer applications
Polymers & elastomers
Combine internal inspection and dimensional measurement in a single acquisition. Check external and internal geometries, compare your parts with CAD and obtain usable data for product validation and quality control.

Learn more about dimensional measurement applications

CT metrology

Can’t find your application?         

Discover all our market applications
Contact an RX expert

Our specialists support you in assessing the feasibility of your project and identifying the Explorer configuration best suited to your needs.

    Explorer Line   the strengths of the Explorer line from RX Solutions

01

Maximum versatility

2 µm to 200 µm: a single line that meets the majority of industrial and scientific needs (materials analysis, quality control, expertise, R&D or metrology…)
02

Configuration adapted to your needs

Generators, detectors, software, metrology, automation or AI: your system is built around your application and evolves with your needs.
03

FAB & Metrology Series

Customise your system with the Metrology Series or FAB Series, without changing platform, to support the evolution of your needs.
04

A scalable platform

Hardware upgrades, software developments, maintenance and application support allow you to evolve your CT system rather than replace it.

What the Explorer line allows you to do

Micro-tomography
Watch – 230 kV – 60 µm

See what other methods cannot reveal

Access the complete internal structure of your parts without destroying them.

Detect porosities, cracks, inclusions, assembly defects or internal features that are invisible with conventional methods, then analyse their size, location and impact precisely. Turn your inspection data into usable information to better understand your products, your materials and your processes.
3D micro-tomography

Improve the quality of your products

Inspect the entire volume of your parts rather than just a surface. 

Identify critical defects faster, make your validations more reliable and limit the risk of non-conformity before it affects production or your customers. Better visibility inside your products allows you to make quality decisions with greater confidence.
3D micro-tomography
Automotive part – steel welds – 150 kV – 28 µm

Accelerate innovation and decision-making

Analyse your prototypes non-destructively, quickly compare different designs and obtain usable 3D data for your R&D, expertise or quality control projects. Identify the origin of a defect faster, reduce validation lead times and base your technical decisions on visual evidence that everyone involved in the project can understand.
3D micro-tomography

Protect your investment

From materials analysis to quality control, from expertise to CT metrology, a single platform meets a wide variety of applications. 

Shared between several teams or projects, it optimises return on investment while remaining scalable thanks to hardware, software, automation or artificial intelligence upgrades.

From defining your need to using your system



  • Understand your need. We analyse your materials, the size of your parts, the level of detail required, your quality control constraints and your application objectives to identify the most relevant machine configurations.
  • Validate performance on your parts. Our application engineers run tests on your samples to confirm the achievable performance, the image quality and the resolution suited to your application. We work under NDA if needed.
  • Configure the system suited to your application. Generator, detector, software, metrology options, automation or artificial intelligence: we build a configuration suited to your current needs while anticipating their future evolution.
  • Train your teams and make them autonomous. The system is manufactured and tested in France, near Annecy, then installed at your site. Users receive training centred on their applications so that they quickly become autonomous.
  • Evolve your CT system over time. Preventive maintenance, application support, software updates, further training and upgrades: our Care & Performance team supports you throughout the life of your system to maintain its performance and support the evolution of your needs.
3D micro-tomography
Cercomacra nigrescens – 100 kV – 95 µm
3D micro-tomography
Battery – 5 µm – 150 kV
Plastic car handle – 110 kV – 46 µm
Plastic car handle – 110 kV – 46 µm
Plastic car handle – 110 kV – 46 µm
Metal part – 150 kV – 13 µm

FAQ: micro-tomography

What is the difference between Explorer, Nano and Force?
The Explorer, Nano and Force lines meet different needs in industrial CT. Explorer is the most versatile line. It covers the majority of industrial and scientific applications, from materials analysis to quality control, expertise and metrology. It is generally the best choice to meet around 80% of CT needs with a single platform. Nano is intended for applications requiring an extreme level of detail. With resolutions reaching the submicron scale, it makes it possible to observe microstructures, fine porosities, interfaces or phenomena that are invisible with conventional micro-tomography. Force is designed for applications requiring strong X-ray penetration. It makes it possible to inspect thick metal parts, highly absorbing materials or large components thanks to its high energy of up to 450 kV. 

In short:
  • Explorer – versatility for the majority of CT applications. 
  • Nano – submicron resolution to see more detail. 
  • Force – high energy to pass through the densest materials. If you are unsure between several lines, our experts can guide you according to the size of your parts, the materials to be inspected and the level of detail required.
Can I inspect any type of object with my Explorer CT system?
The Explorer line covers a wide resolution range (2 µm to 200 µm) and a wide range of part sizes (from a few millimetres to over a metre depending on the platform), which allows it to handle the vast majority of materials and applications. For extreme cases – submicron resolution or very dense materials requiring strong penetration – the Nano and Force lines provide a more specific answer.
Is an Explorer CT system complicated to use?
No. The interfaces have been designed so that technicians and engineers alike can quickly carry out quality inspections, without in-depth CT expertise.
Can I also carry out dimensional measurements with an Explorer CT system?
Yes. In the Metrology version, the Explorer line delivers accurate dimensional measurements compliant with the VDI/VDE 2630 guideline, in addition to internal defect detection – in a single inspection operation.
Can I upgrade my system after installation?
Yes. You can add new detectors, generators and software without replacing your original equipment. Your CT system is supported throughout its life by the Care & Performance team

Discover our Lines

Still unsure which CT system suits you best?

Qualify my CT need


Dental part scanned by Explorer micro-tomography Aerospace part in metal additive manufacturing 

EXPLORER

Versatile micro-tomography

2 µm RESOLUTION
300 kV SOURCE VOLTAGE
< 1 µm MIN. VOXEL

Reveal the invisible at the micron scale.

Access the finest microstructures, porosities and interfaces with a resolution down to the nanometre scale.

Platforms Easytom S · Easytom L · Easytom XL · EasyTom B
 Discover the Explorer line      
Microscopic structure analysed at nanometric resolution Life sciences, Wood

NANO

Nanometric analysis

250 nm RESOLUTION
160 kV SOURCE VOLTAGE
30 nm MIN. VOXEL

Reveal the smallest details with nanometric precision.

Nanometric resolutions to characterise microstructures, porosities and interfaces at a scale that optical microscopy cannot reach.

Platforms Easytom L · Easytom XL · Ultratom
 Discover the Nano line      
Electronic component inspected by Force high-energy tomography Titanium additive manufacturing injector 

FORCE

High-energy solution

4 µm RESOLUTION
450 kV SOURCE VOLTAGE
250 kgs Load up to

See through the densest materials.

Inspect thick metal parts, complex assemblies and highly absorbing components with optimal image quality.

Platforms Easytom L · Easytom B
 Discover the Force line      

Download the brochure



Which Explorer configuration suits your needs?

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ILS NOUS FONT CONFIANCE pour leur système micro-ct

Safran
Schneider electric
L'oréal
Michelin
Valeo
ariane group
legrand
dupond
BIC


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