Metrology Series

CT systems for certified dimensional accuracy

Metrologie dimensionnelle par tomographie

Metrology Series

Non destructive 3D measurement of internal & external features, VDI/VDE compliant

X-ray tomography has revolutionized research as well as industrial quality control by enabling comprehensive three-dimensional analyses—both internal and external—in a single scan, and most importantly, in a non-destructive manner (NDT).

For dimensional measurements, more traditional methods have long dominated the field—contact coordinate measuring machines (CMMs), 3D optical scanners, vision systems, and portable measuring arms. Each excels in its own area: CMMs for high point-by-point precision, optical scanners for speed on large surfaces, vision systems for 2D measurements, and portable arms for on-site flexibility. These methods remain relevant and will continue to be so for many applications. However, they share a common limitation: the inability to access internal geometries without cutting or disassembly.

CT tomography solves this challenge by providing a complete volumetric view while preserving the integrity of the part. It reconstructs the full 3D volume and enables simultaneous measurement of internal and external geometries, wall thicknesses, geometric and dimensional tolerances (GD&T), and CAD-to-actual deviations, with a data density unattainable by traditional approaches.

But turning this technological capability into reliable metrological results requires more than just a CT scanner. That’s where our Metrology Series comes in: industrial tomography systems specifically designed for high-precision dimensional metrology. Certified according to VDI/VDE 2630, with a clearly defined maximum permissible error (MPE) and verified performance, these platforms guarantee traceability, repeatability, and comparability of results over time—solid, auditable metrological evidence.

Available in EasyTom S Metrology configurations (for small to medium parts) and EasyTom L Metrology (for large parts and high flexibility), these systems combine the power of 3D tomography with the rigor of industrial metrology equipment. This solution meets the needs of R&D, industrialization, and quality teams: more precise decisions, shorter development cycles, and reliable series inspection.

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VDI/VDE 2630 : the reference metrology certification

How can we guarantee the traceability of dimensional measurements by CT?

A CT scanner can produce stunning 3D images and reveal the internal structures of a part. But that alone doesn’t make it a metrology system. The difference? Certification according to the VDI/VDE 2630 standard.

What is the VDI/VDE 2630 standard

Developed by the Association of German Engineers (VDI) and the German Association for Electrical, Electronic & Information Technologies (VDE), this standard defines standardized methods to:

Test and qualify the metrological performance of a CT system

Determine the system’s maximum permissible error (MPE)

Establish protocols for periodic verification

Guarantee measurement traceability according to recognized standards

What certification guarantees:

✓ Traceability : Every measurement can be linked to national/international standards

✓ Repeatability : Measurements remain stable over time

✓ Comparability : Your results can be compared with other certified systems

✓ Documentation: : BEP (Best Examination Practice) report certifying performance

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MPE Maximum permissible error - Metrology

MPE: Understanding the Key Metrological Performance Indicator

The MPE (Maximum Permissible Error) is maximum allowable error measured according to the VDI/VDE 2630 standard, using calibrated artifacts under controlled conditions. But what does it really mean for your daily measurements?

What the MPE indicates:

An overall level of performance that the machine can achieve
A criterion for comparing different CT systems
A traceable accuracy value obtained through standardized tests

What the MPE does NOT guarantee:

The MPE is not a guarantee that every individual measurement will fall below this value. Why? Because CT measurement accuracy strongly depends on:

The material of the part (density, contrast)
The positioning of the part within the measurement volume
Les paramètres d'acquisition (tension, courant, temps d'intégration)
Acquisition parameters (voltage, current, integration time)
The geometry of the part (complexity, feature size)

Therefore, the MPE does not represent actual production accuracy, but rather a metrological potential measured under standardized conditions. It is a standardized indicator of the metrological potential of a CT system, useful for:

Comparing different machines
Understanding the metrological limits of the system
Establishing protocols for periodic verification

The Metrology series at RX Solutions

RX Solutions Metrology Series systems stand out with a dedicated approach to dimensional metrology by tomography. Beyond compliance with VDI/VDE 2630-1.3 and ASME B89.4.23, our CT scanners integrate exclusive hardware and software technologies specific to the Metrology Series, ensuring daily stability, traceability, and repeatability for your measurements.

Hardware dedicated to precision

Internal thermal regulation

Internal thermal regulation maintains critical components (detector, X-ray source, manipulator) at a stable temperature of ±0.5°C. This ensures long-term stability and repeatability, while eliminating thermal drift during scans.

Dampers

In addition to an extremely stable granite table, dampers isolate the table from external vibrations, ensuring stable and repeatable measurements even in industrial environments.

Linear encoders

Linear encoders and mechanical backlash compensation provide micron-level accuracy during movements and unmatched repeatability in positioning.

Internal thermal regulation

Internal thermal regulation maintains critical components (detector, X-ray source, manipulator) at a stable temperature of ±0.5°C. This ensures long-term stability and repeatability, while eliminating thermal drift during scans.

Dampers

In addition to an extremely stable granite table, dampers isolate the table from external vibrations, ensuring stable and repeatable measurements even in industrial environments.

Linear encoders

Linear encoders and mechanical backlash compensation provide micron-level accuracy during movements and unmatched repeatability in positioning.

Software tools dedicated to the Metrology Series

An optimized software workflow for metrology

Plug-in Scaling Error

Enables precise determination of the system’s actual magnification. Automatically detects the certified ball-bar and applies a scale correction that compensates for micro thermal and geometric variations.

Advanced STL export

The integrated STL export uses sub-pixel surface determination algorithms that extract geometries with accuracy exceeding voxel size.

Metrology software compatibility

Scans from the Metrology Series are natively compatible with:

VG Studio
VG Inline
Polyworks

Metrological Support and Calibration
Traceability and performance guaranteed over time

Factory Calibration

Before delivery, each Metrology Series system undergoes double factory calibration: detector distortion correction and ultra-fine alignment. This calibration ensures VDI/VDE 2630-1.3 compliance from installation. A BEP (Best Equipment Performance) report documenting performance tests is provided with each system.

Certified Ball-Bar

A certified 100mm ball-bar gauge is included with every system, enabling automatic daily scale correction via the Scaling Error plug-in. This gauge guarantees traceability to national institutes (PTB, NIST, LNE) and allows regular verification of the system’s metrological performance.

Dedicated Support

Our dedicated support program includes annual (or more frequent if needed) performance verification. If any drift is detected, on-site recalibration is performed by our teams to maintain VDI/VDE 2630-1.3 compliance throughout the system’s lifecycle.

Metrological compliance guaranteed

Thanks to initial factory calibration, daily verification tools (ball-bar), and the annual maintenance program, your Metrology Series systems remain compliant with VDI/VDE 2630-1.3 and ASME B89.4.23 metrological standards over time.