Guaranteed compliance and traceability
Each Metrology Series system is characterized according to VDI/VDE 2630‑1.3 standard with an MPE_SD:
- EasyTom S: 5.5 μm + L/50
- EasyTom L: 5.5 μm + L/50 (25x32) | 6 μm + L/50 (43x43)
This MPE_SD relies on calibrated reference tools (multi‑sphere gauges) and validated calibration procedures
A dedicated software ecosystem
Beyond mechanical performance, the Metrology Series is supported by a specialized software suite:
- Advanced sub‑pixel detector distortion correction
- Automatic magnification factor scale calibration
- High‑quality STL export: compatible with metrology software workflows
The versatility of a CT system without compromise
- Global material analyses : dimensional analysis, internal defect detection, multi‑material assemblies, additive manufacturing components…
- Versatility: a single machine for metrology, material inspection, CAD comparison, assembly analysis, porosity evaluation, and more
- Productivity: millions of 3D points captured in a single scan, without complex programming
- Traceability & compliance: certified calibration, performance monitoring, and compliance with industrial standards
Unlike tactile or optical CMM solutions, metrological CT offers a unique advantage: the ability to simultaneously inspect external geometries, internal cavities, assemblies, and porosities — all in one non‑destructive scan.
“ With the Metrology Series, we provide industrials and researchers with an uncompromising dimensional inspection tool, combining certified accuracy, application versatility, and ease of integration. It is a key milestone in democratizing CT metrology and supporting the transformation of manufacturing and quality control processes.” — Roland Le Floc’h, Product Manager at RX Solutions